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協助翻譯謝謝
This document does not relieve the supplier of the responsibility to assure that a product meets thecomplete set of its requirements.
這句不曉得怎麼翻譯?怎麼翻都不順
我自己翻的結果是這樣:這份文件無法減輕使用者對於確定產品達成完整一系列的需求的責任.
請各位幫忙一下,謝謝<div></div> 本帖最後由 avontube 於 2012-2-23 09:57 PM 編輯
"This document does not relieve the supplier of the responsibility to assure that a product meets the complete set of its requirements."
The above sentence is not written by a native speaker. As much of my doubt, it is perhaps translated from another langauge. Basically, the sentence tries to express that, "the document does not make the supplier less responsible on the assurance, which needs to ensure the product meet every single requirement."
So, I would suggest the following translation:
本産品應符合所有的規格,此文件並不影響供應商所應承擔的責任。
...<div class='locked'><em>瀏覽完整內容，請先 <a href='member.php?mod=register'>註冊</a> 或 <a href='javascript:;' onclick="lsSubmit()">登入會員</a></em></div> 本帖最後由 d9138851 於 2012-2-24 09:39 AM 編輯
感謝你的回覆,如果我提供文章會不會比較容易翻譯這一句話?
以下是文章的內容:
This standard describes a baseline set of acceptance tests for use in qualifying electronic components as
new products, a product family, or as products in a process which is being changed.
These tests are capable of stimulating and precipitating semiconductor device and packaging failures.
The objective is to precipitate failures in an accelerated manner compared to use conditions. Failure Rate
projections usually require larger sample sizes than are called out in qualification testing. For guidance
on projecting failure rates, refer to JESD85 Methods for Calculating Failure Rates in Units of FITs. This
qualification standard is not aimed at extreme use conditions such as military applications, automotive
under-the-hood applications, or uncontrolled avionics environments, nor does it address 2nd level
reliability considerations, which are addressed in JEP150.
This set of tests should not be used indiscriminately. Each qualification project should be examined for:
a) Any potential new and unique failure mechanisms.
b) Any situations where these tests/conditions may induce invalid or overstress failures.
If it is known or suspected that failures either are due to new mechanisms or are uniquely induced by the
severity of the test conditions, then the application of the test condition as stated is not recommended.
Alternatively, new mechanisms or uniquely problematic stress levels should be addressed by building an
understanding of the mechanism and its behavior with respect to accelerated stress conditions (Ref.
JESD91, “Method for Developing Acceleration Models for Electronic Component Failure Mechanisms”
and JESD94, “Application Specific Qualification using Knowledge Based Test Methodology”).
Where use conditions are established, qualification testing tailored to meet those specific requirements
optimizes resources and is the preferred approach to this default standard (Ref. JESD94).
Consideration of assembly-level effects may also be necessary. For guidance on this, refer to JEP150,
Stress-Test-Driven Qualification of and Failure Mechanisms Associated with Assembled Solid State
Surface-Mount Components.
This document does not relieve the supplier of the responsibility to assure that a product meets the
complete set of its requirements....<div class='locked'><em>瀏覽完整內容，請先 <a href='member.php?mod=register'>註冊</a> 或 <a href='javascript:;' onclick="lsSubmit()">登入會員</a></em></div> d9138851 發表於 2012-2-24 09:36 AM static/image/common/back.gif
感謝你的回覆,如果我提供文章會不會比較容易翻譯這一句話?
以下是文章的內容:
This standard describes a b ...
試看看這樣：此文件無法讓供應商，免去確定產品需符合其完整必要條件的責任。 d9138851 發表於 2012-2-24 09:36 AM static/image/common/back.gif
感謝你的回覆,如果我提供文章會不會比較容易翻譯這一句話?
以下是文章的內容:
This standard describes a b ...
I think, the sentence at the end is a disclaimer. Basically, the document describes the terms and conditions of testing some semiconductor devices in the accelerated (aging) mode to find the possible failure. (My personal experience is that, the failure may caused by the electromagnetic induced stress, inter-junction property change, etc., and it is highly dependent on the applications, thus the test conditions.)
The author of the document wishes to declare that, even if a semiconductor product passes the accelerated failure test, it does not mean or imply that it is a product suitable for the consumer market. The product should also fulfill other specifications or standards, which are not mentioned here, in order for it to be suitable for the market.
...<div class='locked'><em>瀏覽完整內容，請先 <a href='member.php?mod=register'>註冊</a> 或 <a href='javascript:;' onclick="lsSubmit()">登入會員</a></em></div><br><br><br><br><br><div></div> avontube 發表於 2012-2-23 09:56 PM static/image/common/back.gif
"This document does not relieve the supplier of the responsibility to assure that a product meets th ...
我覺得你這樣翻譯比較通順. 本帖最後由 d9138851 於 2012-2-25 11:12 AM 編輯
avontube 發表於 2012-2-25 12:16 AM http://www.eyny.com/static/image/common/back.gif
I think, the sentence at the end is a disclaimer. Basically, the document describes the terms and ...
非常感謝你的回應,也謝謝其他人的回應
透過你的解釋有比較了解這句的意思了.
即使產品透過這份文件的測試內容,但是不見得是符合使用者在現實使用狀況條件,若要完整的符合使用者的使用條件,可能必須要做其他測試實驗.
不曉得這樣的說法對不對?
...<div class='locked'><em>瀏覽完整內容，請先 <a href='member.php?mod=register'>註冊</a> 或 <a href='javascript:;' onclick="lsSubmit()">登入會員</a></em></div>
謝謝版大的分享唷 ~!! 希望能一步一步邁進~~
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